Characterization of single ZnO nanorods by conductive atomic force microscopy
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Characterization of single ZnO nanorods by conductive atomic force microscopy. / Kratzer, Markus; Beinik, Igor; Teichert, Christian et al.
2009. Poster session presented at ÖPG Jahrestagung, Innsbruck.
2009. Poster session presented at ÖPG Jahrestagung, Innsbruck.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Kratzer, M, Beinik, I, Teichert, C, Wang, L, Brauer, G & Anwand, W 2009, 'Characterization of single ZnO nanorods by conductive atomic force microscopy', ÖPG Jahrestagung, Innsbruck, 2/09/09 - 4/09/09.
APA
Kratzer, M., Beinik, I., Teichert, C., Wang, L., Brauer, G., & Anwand, W. (2009). Characterization of single ZnO nanorods by conductive atomic force microscopy. Poster session presented at ÖPG Jahrestagung, Innsbruck.
Vancouver
Kratzer M, Beinik I, Teichert C, Wang L, Brauer G, Anwand W. Characterization of single ZnO nanorods by conductive atomic force microscopy. 2009. Poster session presented at ÖPG Jahrestagung, Innsbruck.
Author
Bibtex - Download
@conference{c07a2fceb521430e86162add4db8c4a4,
title = "Characterization of single ZnO nanorods by conductive atomic force microscopy",
author = "Markus Kratzer and Igor Beinik and Christian Teichert and Lin Wang and Gerhard Brauer and Wolfgang Anwand",
year = "2009",
language = "English",
note = "{\"O}PG Jahrestagung ; Conference date: 02-09-2009 Through 04-09-2009",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Characterization of single ZnO nanorods by conductive atomic force microscopy
AU - Kratzer, Markus
AU - Beinik, Igor
AU - Teichert, Christian
AU - Wang, Lin
AU - Brauer, Gerhard
AU - Anwand, Wolfgang
PY - 2009
Y1 - 2009
M3 - Poster
T2 - ÖPG Jahrestagung
Y2 - 2 September 2009 through 4 September 2009
ER -
