Igor Beinik
(Former)
Research output
- Published
AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2
Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Application of conductive AFM technique to measure electrical conductance of tribofilms
Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009, Proceedings of 26th Danubia-Adria Symposium on Advances in Experimental Mechanics. p. 205-206Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Application of conductive AFM technique to measure electrical conductance of tribofilms
Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, In: Solar energy materials and solar cells. 95, p. 1949-1954Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of single ZnO nanorods by conductive atomic force microscopy
Kratzer, M., Beinik, I., Teichert, C., Wang, L., Brauer, G. & Anwand, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560Research output: Contribution to journal › Article › Research › peer-review
- Published
Combined C-AFM/PFM investigations of ZnO nanorods
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures
Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
