Igor Beinik

(Former)

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Research output

  1. Published

    Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns

    Lang, W., Marksteiner, M., Bodea, M. A., Siraj, K., Pedarnig, J. D., Kolarova, R., Bauer, P., Hasengrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2012, In: Nuclear instruments & methods in physics research / B Beam interactions with materials and atoms. 272, p. 300-304

    Research output: Contribution to journal › Article › Research › peer-review

  2. Published

    Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

    Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009, Proceedings of 26th Danubia-Adria Symposium on Advances in Experimental Mechanics. p. 205-206

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  4. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Scanning Probe Microscopy-based Characterization of ZnO Nanorods

    Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  6. Published

    Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics

    Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

  7. Published

    Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

    Tejedor, P., Díez-Merino, L., Beinik, I. & Teichert, C., 2009, In: Applied physics letters. 95, p. 123103-1-123103-3

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz

    Tejedor, P., Vázquez, L., Díez-Merino, L., Beinik, I. & Teichert, C., 2008.

    Research output: Contribution to conference › Poster › Research › peer-review

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