Gerhard Dehm

(Former)

Research output

  1. 2005
  2. Published

    Obtaining different orientation relationships for Cu films grown on (0001) alpha-Al2O3 substrates by magnetron sputtering

    Dehm, G., Edongué, H., Wagner, T., Oh, S. H. & Arzt, E., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 249-254

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Precipitation hardening in Mg-Zn-Sn alloys with minor additions of Ca and Si

    Cohen, S., Goren-Muginstein, G., Avraham, S., Rashkova, B., Dehm, G. & Bamberger, M., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1081-1087

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published

    SAXS & WAXS experiments on a PE sample with NanoSTAR

    Görgl, R. & Dehm, G., 2005

    Research output: Book/ReportCommissioned reportTransferpeer-review

  5. Published

    SAXS Messungen an Nickel-Basislegierungen

    Görgl, R. & Dehm, G., 2005

    Research output: Book/ReportCommissioned reportTransferpeer-review

  6. Published

    SAXS experiments on Fe-alloys using the NanoSTAR

    Görgl, R. & Dehm, G., 2005

    Research output: Book/ReportCommissioned reportTransferpeer-review

  7. Published

    SAXS experiments on Ni-alloys using the NaoSTAR

    Görgl, R. & Dehm, G., 2005

    Research output: Book/ReportCommissioned reportTransferpeer-review

  8. Published

    SAXS experiments on a BaTiO3 sample using the NanoSTAR

    Görgl, R. & Dehm, G., 2005

    Research output: Book/ReportCommissioned reportTransferpeer-review

  9. Published

    SAXS experiments on a powder sample using the NanoSTAR

    Görgl, R. & Dehm, G., 2005

    Research output: Book/ReportCommissioned reportTransferpeer-review

  10. Published

    SAXS experiments on polymeric solutions using the NanoSTAR

    Görgl, R. & Dehm, G., 2005

    Research output: Book/ReportCommissioned reportTransferpeer-review

  11. Published

    Sekundärionen-Massensprektroskopie (SIMS) mittels FIB

    Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 199-200

    Research output: Chapter in Book/Report/Conference proceedingChapterResearch