Gerhard Dehm
(Former)
171 - 175 out of 175Page size: 10
Research output
- Published
Advanced nanomechanics in the TEM: effects of thermal annealing on FIB prepared Cu samples
Kiener, D., Zhang, Z., Sturm, S., Cazottes, S., Imrich, P. J., Kirchlechner, C. & Dehm, G., 2012, In: Philosophical magazine. 92, p. 3269-3289Research output: Contribution to journal › Article › Research › peer-review
- Published
Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Adhesion Energies of Cr Thin Films on Polyimide Determined from Buckling: Experiment and Model
Cordill, M., Fischer, F. D., Rammerstorfer, F. G. & Dehm, G., 2010, In: Acta materialia. 58, p. 5520-5531Research output: Contribution to journal › Article › Research › peer-review
- Published
A Comparison of the Electronic Structure of N-K in TiN and VN using EELS and ab-initio Calculations
Rashkova, B., Kothleitner, G., Sturm, S., Scheu, C., Kutschej, K., Mitterer, C., Lazar, P., Redinger, J., Podloucky, R. & Dehm, G., 2007, Microscopy and Microanalysis. p. 414-415Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
A comparative micro-cantilever study of the mechanical behavior of silicon based passivation films
Matoy, K., Schönherr, H., Detzel, T., Schöberl, T., Pippan, R., Motz, C. & Dehm, G., 2009, In: Thin solid films. 518, p. 247-256Research output: Contribution to journal › Article › Research › peer-review
