Daniel Kiener

Research output

  1. Published

    Cyclic response of copper single crystal micro-beams

    Kiener, D., Motz, C., Grosinger, W., Weygand, D. & Pippan, R., 2010, In: Scripta materialia. p. 500-503

    Research output: Contribution to journalArticleResearchpeer-review

  2. Published

    Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction

    Maaß, R., Van Petegem, S., Grolimund, D., Van Swygenhoven, H., Kiener, D. & Dehm, G., 2008, In: Applied physics letters. 92, p. 071905-1-071905-4

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

    Zalesak, J., Bartosik, M., Daniel, R., Mitterer, C., Krywka, C., Kiener, D., Mayrhofer, P. H. & Keckes, J., 2016, In: Acta materialia. 102, p. 212-219 8 p.

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published

    Critical assessment of the determination of residual stress profiles in thin films by means of the ion beam layer removal method

    Schöngrundner, R., Treml, R., Antretter, T., Kozic, D., Ecker, W. & Kiener, D., 2014, In: Thin solid films. p. 321-330

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    Crack length estimations for small-scale fracture experiments via image processing techniques

    Schmuck, K., Alfreider, M. & Kiener, D., 14 Sept 2022, In: Journal of Materials Research. 37.2022, 17, p. 2848-2861 14 p., 17.

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published

    Crack arrest in thin metallic film stacks due to material- and residual stress inhomogeneities

    Kozic, D., Gänser, H.-P., Brunner, R., Kiener, D., Antretter, T. & Kolednik, O., 31 Dec 2018, In: Thin solid films. p. 14-22 9 p.

    Research output: Contribution to journalArticleResearchpeer-review

  7. Published

    Correlative microstructure and topography informed nanoindentation of copper films

    Bigl, S., Schöberl, T., Wurster, S., Cordill, M. & Kiener, D., 25 Dec 2016, In: Surface & coatings technology. 308.2016, 25 December, p. 404-413 10 p.

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published

    Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films

    Glechner, T., Lang, S., Hahn, R., Alfreider, M., Moraes, V., Primetzhofer, D., Ramm, J., Kolozsvári, S., Kiener, D. & Riedl, H., 19 Jul 2020, In: Surface and Coatings Technology. 399.2020, 15 October, 8 p., 126212.

    Research output: Contribution to journalArticleResearchpeer-review

  9. Published
  10. Published

    Conventional TEM Investigation of the FIB Damage in Copper

    Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, Microscopy Conference, International Forum for Advanced Microscopy. p. 100-101

    Research output: Chapter in Book/Report/Conference proceedingConference contribution