Conventional TEM Investigation of the FIB Damage in Copper
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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| Translated title of the contribution | Conventional TEM Investigation of the FIB Damage in Copper |
|---|---|
| Original language | English |
| Title of host publication | Microscopy Conference, International Forum for Advanced Microscopy |
| Pages | 100-101 |
| Publication status | Published - 2007 |
