Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • Thomas Glechner
  • S. Lang
  • R. Hahn
  • Vincent Moraes
  • Daniel Primetzhofer
  • Jürgen Ramm
  • S. Kolozsvári
  • Helmut Riedl

Organisational units

External Organisational units

  • Institute of Materials Science and Technology
  • Uppsala University
  • Oerlikon Surface Solutions AG
  • Plansee Composite Materials GmbH

Details

Original languageEnglish
Article number126212
Number of pages8
JournalSurface and Coatings Technology
Volume399.2020
Issue number15 October
DOIs
Publication statusPublished - 19 Jul 2020