Christian Robert Hofer

(Former)

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Research output

  1. 2005
  2. Published

    Nanomagnet arrays fabricated on self-organized semiconductor templates

    Hofer, C. & Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    Nanomagnet arrays fabricated on self-organized semiconductor templates

    Teichert, C. & Hofer, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    Nanomagnet arrays fabricated on self-organized semiconductor templates

    Hofer, C. & Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Nanostructure formation on ion eroded SiGe and Si surfaces

    Hofer, C. & Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Nanostructure formation on ion-eroded SiGe films on Si(001)

    Hofer, C. & Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Surface Compositional gradients of InAs/GaAs quantum dots

    Hofer, C. & Teichert, C., 2005, In: Applied physics letters. 87

    Research output: Contribution to journal › Article › Research › peer-review

  8. 2004
  9. Published

    Ion bombardment induced morphology modifications on self-organized semiconductor surfaces

    Hofer, C., Teichert, C. & Kasper, E., 2004, In: Nuclear instruments & methods in physics research / B Beam interactions with materials and atoms. 216, p. 178-184

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    Nanostructure formation on ion-eroded SiGe film surfaces

    Hofer, C., Teichert, C. & Kasper, E., 2004, In: Superlattices and microstructures. 36, p. 281-291

    Research output: Contribution to journal › Article › Research › peer-review

  11. 2003
  12. Published

    Modification and characterization of thin silicon gate oxides using conducting atomic force microscopy

    Kremmer, S., Peissl, S., Teichert, C., Kuchar, F. & Hofer, C., 2003, In: Materials science and engineering B (Solid-state materials for advanced technology). 102, p. 88-93

    Research output: Contribution to journal › Article › Research › peer-review

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