Christian Mitterer
Research output
- Published
Multifunctional multi-component PVD coatings for cutting tools
Kathrein, M., Michotte, C., Penoy, M., Polcik, P. & Mitterer, C., 2005, In: Surface & coatings technology. 200, p. 1867-1871Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751Research output: Contribution to journal › Article › Research › peer-review
- Published
Self-organized periodic soft-hard nanolamellae in polycrystalline TiAlN thin films
Keckes, J., Daniel, R., Mitterer, C., Matko, I., Sartory, B., Köpf, A., Weißenbacher, R. & Pitonak, R., 2013, In: Thin solid films. 545, p. 29-32Research output: Contribution to journal › Article › Research › peer-review
- Published
Novel TiAlN nanostructured CVD coatings with superior oxidation resistance
Keckes, J., Todt, J., Daniel, R., Mitterer, C., Köpf, A., Weißenbacher, R. & Pitonak, R., 2013.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
Keckes, J., Daniel, R., Bartosik, M., Mitterer, C., Schoeder, S. & Burghammer, M., 2011, Proceeding of International Conference on Metallurgical Coatings and Thin Films. p. 55-55Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method
Keckes, J., Eiper, E., Martinschitz, K. J., Köstenbauer, H., Daniel, R. & Mitterer, C., 2007, In: Review of scientific instruments. 78, p. 036103-01-036103-03Research output: Contribution to journal › Article › Research › peer-review
- Published
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.Research output: Contribution to conference › Poster › Research › peer-review
- Published
30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film
Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873Research output: Contribution to journal › Article › Research › peer-review
- Published
Temperature-dependent wear mechanisms for magnetron sputtered AlTiTaN hard coatings
Khetan, V., Valle, N., Duday, D., Michotte, C., Mitterer, C., Delplancke, M.-P. & Choquet, P., 2014, In: ACS Applied Materials & Interfaces. 6, p. 15403-15411Research output: Contribution to journal › Article › Research › peer-review
