Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080

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Effect of wavelength modulation of arc evaporated Ti-Al-N/Ti-Al-V-N multilayer coatings on microstructure and mechanical/tribological properties

Pfeiler-Deutschmann, M., Mayrhofer, P. H., Chladil, K., Penoy, M., Michotte, C., Kathrein, M. & Mitterer, C., 1 Jan 2015, In: Thin solid films. 581, p. 20-24 5 p.

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Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite

Plank, H., Resel, R., Sitter, H., Andreev, A., Sariciftci, N. S., Hlawacek, G., Teichert, C., Thierry, A. & Lotz, B., 2003, In: Thin solid films. 443, p. 108-114

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Seed layer stimulated growth of crystalline high Al containing (Al,Cr)2O3 coatings deposited by cathodic arc evaporation

Pohler, M., Franz, R., Ramm, J., Polcik, P. & Mitterer, C., 2014, In: Thin solid films. 550, p. 95-104

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Studies on the morphology of Al2O3 thin films grown by Atomic Layer Epitaxy

Prohaska, T., Ritala, M., Saloniemi, H., Leskelä, M. & FRIEDBACHER, G., 1996, In: Thin solid films. p. 54-58

Research output: Contribution to journal › Article › Research › peer-review

Development of crystallinity and morphology in hafnium dioxide thin films grown by Atomic Layer Epitaxy

Prohaska, T., Ritala, M., Leskelä, M., Niinistö, L., FRIEDBACHER, G. & GRASSERBAUER, M., 1994, In: Thin solid films. p. 72-80

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Surface roughness reduction in Atomic Layer Epitaxy growth of titanium dioxide thin films

Prohaska, T., Ritala, M., Leskelä, M., Niinistö, L., FRIEDBACHER, G. & GRASSERBAUER, M., 1994, In: Thin solid films. p. 155-162

Research output: Contribution to journal › Article › Research › peer-review

Nanoindentation of chemical-vapor deposited Al₂O₃ hard coatings at elevated temperatures

Rebelo De Figueiredo, M., Abad, M. D., Harris, A. J., Czettl, C., Mitterer, C. & Hosemann, P., 2015, In: Thin solid films. 578, p. 20-24

Research output: Contribution to journal › Article › Research › peer-review

Structure and Properties of Pulsed-Laser Deposited Carbon Nitride Thin Films

Riascos, H., Neidhardt, J., Radnoczi, G. Z., Emmerlich, J., Zambrano, G., Hultman, L. & Prieto, P., 2006, In: Thin solid films. 497, p. 1-6

Research output: Contribution to journal › Article › Research › peer-review

Influence of oxygen impurities on growth morphology, structure and mechanical properties of Ti–Al–N thin films

Riedl, H., Munnik, F., Hutter, H., Mendez Martin, F., Kolozsvari, S., Bartosik, M., Mayrhofer, P. H., Koller, C. & Rachbauer, R., 2016, In: Thin solid films. 603, p. 39-49 10 p.

Research output: Contribution to journal › Article › Research › peer-review