Review of scientific instruments, 0034-6748
Journal
| ISSNs | 0034-6748 |
|---|
11 - 12 out of 12Page size: 10
Research output
- 2010
- Published
Imaging dislocations in gallium nitride across broad areas using atomic force microscopy
Bennett, S. E., Holec, D., Kappers, M. J., Humphreys, C. J. & Oliver, R. A., 2010, In: Review of scientific instruments. p. 0637011-0637017Research output: Contribution to journal › Article › Research › peer-review
- 2007
- Published
High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method
Keckes, J., Eiper, E., Martinschitz, K. J., Köstenbauer, H., Daniel, R. & Mitterer, C., 2007, In: Review of scientific instruments. 78, p. 036103-01-036103-03Research output: Contribution to journal › Article › Research › peer-review
