Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning

Activity: Talk or presentation Oral presentation

Participants

Date

23 Jul 2024

Georg Holub - Speaker

Sebastian Hofer - contributor

Thomas Obermüller - contributor

Lorenz Romaner - contributor

23 Jul 2024

Event (Conference)

Title8th European Conference on Crystal Growth (ECCG8)
Period21/07/2425/07/24
CityWarschau
Country/TerritoryPoland