Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning
Activity: Talk or presentation › Oral presentation
Participants
- Georg Holub - Speaker
- Sebastian Hofer - contributor
- Thomas Obermüller - contributor
- Lorenz Romaner - contributor
Date
23 Jul 2024
Georg Holub - Speaker
Sebastian Hofer - contributor
Thomas Obermüller - contributor
Lorenz Romaner - contributor
23 Jul 2024
Event (Conference)
Title | 8th European Conference on Crystal Growth (ECCG8) |
---|---|
Period | 21/07/24 → 25/07/24 |
City | Warschau |
Country/Territory | Poland |