Simulation of stress distribution in assembled silicon dies and deflection of printed circuit boards
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Proceedings of the 15th International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems EuroSimE 2014. 2014.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
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TY - GEN
T1 - Simulation of stress distribution in assembled silicon dies and deflection of printed circuit boards
AU - Macurova, Katerina
AU - Angerer, Paul
AU - Antretter, Thomas
AU - Bermejo Moratinos, Raul
AU - Maia, Wilson
AU - Schöngrundner, Ronald
AU - Krivec, Thomas
AU - Morianz, Mike
AU - Brizoux, Michel
PY - 2014
Y1 - 2014
M3 - Conference contribution
SN - 978-1-4799-4791-1
BT - Proceedings of the 15th International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems EuroSimE 2014
ER -