Publikationen

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2006
Veröffentlicht
Comparison of measurements on PET samples with RAG and sealed tube: Aarhus (RAG) & Leoben (sealed tube)
Görgl, R. & Dehm, G., 2006
Publikationen: Buch/Bericht › Forschungsbericht › Transfer › (peer-reviewed)
Veröffentlicht
Cube textured tapes for use in YBa2Cu3O7-δ-coated conductor applications
Obst, B., Nast, R., Kotzyba, G., Wetscher, F. & Dehm, G., 2006, in: International journal of materials research : IJMR ; Zeitschrift für Metallkunde. 97, S. 1363-1371
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Damage development during cyclic loading - from micro to macro properties. Bericht 3
Yang, B. & Dehm, G., 2006
Publikationen: Buch/Bericht › Forschungsbericht › Transfer › (peer-reviewed)
Veröffentlicht
Damage development during cyclic loading - from micro to macro properties. Bericht 4
Yang, B. & Dehm, G., 2006
Publikationen: Buch/Bericht › Forschungsbericht › Transfer › (peer-reviewed)
Veröffentlicht
Determination of Mechanical Properties of Copper at the Micron Scale
Kiener, D., Motz, C., Schöberl, T., Jenko, M. & Dehm, G., 2006, in: Advanced engineering materials. 8, S. 1119-1125
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
GISAXS experiments on Al-coated Si-Wafers with expected “hillocks”
Görgl, R. & Dehm, G., 2006
Publikationen: Buch/Bericht › Forschungsbericht › Transfer › (peer-reviewed)
Veröffentlicht
Grain refinement in gamma-TiAl-based alloys by solid state phase transformations
Clemens, H., Bartels, A., Bystrzanowski, S., Chladil, H., Leitner, H., Dehm, G., Gerling, R. & Schimansky, F-P., 2006, in: Intermetallics. 14, S. 1380-1385
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
High-temperature oxidation resistance of Ta-Si-N films with a high Si content
Zeman, P., Musil, J. & Daniel, R., 2006, in: Surface & coatings technology.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale
Keckes, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W. & Dehm, G., 2006, in: Advanced engineering materials. S. 1084-1088
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
In-Situ TEM Study of Plastic Stress Relaxation Mechanisms and Interface Effects in Metallic Films
Legros, M., Dehm, G. & Balk, T. J., 2006, In-Situ TEM Study of Plastic Stress Relaxation Mechanisms and Interface Effects in Metallic Films. Materials Research Society : MRS
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband

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Publikationen

Comparison of measurements on PET samples with RAG and sealed tube: Aarhus (RAG) & Leoben (sealed tube)

Cube textured tapes for use in YBa2Cu3O7-δ-coated conductor applications

Damage development during cyclic loading - from micro to macro properties. Bericht 3

Damage development during cyclic loading - from micro to macro properties. Bericht 4

Determination of Mechanical Properties of Copper at the Micron Scale

GISAXS experiments on Al-coated Si-Wafers with expected “hillocks”

Grain refinement in gamma-TiAl-based alloys by solid state phase transformations

High-temperature oxidation resistance of Ta-Si-N films with a high Si content

In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

In-Situ TEM Study of Plastic Stress Relaxation Mechanisms and Interface Effects in Metallic Films

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