Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer. / Benediktovitch, Andrei I.; Ulyanenkova, Tatjana; Keckes, Jozef et al.
in: Journal of applied crystallography, 2014, S. 1931-938.
in: Journal of applied crystallography, 2014, S. 1931-938.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Benediktovitch, AI, Ulyanenkova, T, Keckes, J & Ulyanenkov, AP 2014, 'Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer', Journal of applied crystallography, S. 1931-938. https://doi.org/10.1107/S1600576714022535
APA
Benediktovitch, A. I., Ulyanenkova, T., Keckes, J., & Ulyanenkov, A. P. (2014). Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer. Journal of applied crystallography, 1931-938. https://doi.org/10.1107/S1600576714022535
Vancouver
Benediktovitch AI, Ulyanenkova T, Keckes J, Ulyanenkov AP. Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer. Journal of applied crystallography. 2014;1931-938. doi: 10.1107/S1600576714022535
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Bibtex - Download
@article{1b103f0ff64f4e019999eb71fd1c41e6,
title = "Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer",
author = "Benediktovitch, {Andrei I.} and Tatjana Ulyanenkova and Jozef Keckes and Ulyanenkov, {Alex P.}",
year = "2014",
doi = "10.1107/S1600576714022535",
language = "English",
pages = "1931--938",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer
AU - Benediktovitch, Andrei I.
AU - Ulyanenkova, Tatjana
AU - Keckes, Jozef
AU - Ulyanenkov, Alex P.
PY - 2014
Y1 - 2014
U2 - 10.1107/S1600576714022535
DO - 10.1107/S1600576714022535
M3 - Article
SP - 1931
EP - 1938
JO - Journal of applied crystallography
JF - Journal of applied crystallography
SN - 0021-8898
ER -
