Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer

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Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer. / Benediktovitch, Andrei I.; Ulyanenkova, Tatjana; Keckes, Jozef et al.
In: Journal of applied crystallography, 2014, p. 1931-938.

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@article{1b103f0ff64f4e019999eb71fd1c41e6,
title = "Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer",
author = "Benediktovitch, {Andrei I.} and Tatjana Ulyanenkova and Jozef Keckes and Ulyanenkov, {Alex P.}",
year = "2014",
doi = "10.1107/S1600576714022535",
language = "English",
pages = "1931--938",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer

AU - Benediktovitch, Andrei I.

AU - Ulyanenkova, Tatjana

AU - Keckes, Jozef

AU - Ulyanenkov, Alex P.

PY - 2014

Y1 - 2014

U2 - 10.1107/S1600576714022535

DO - 10.1107/S1600576714022535

M3 - Article

SP - 1931

EP - 1938

JO - Journal of applied crystallography

JF - Journal of applied crystallography

SN - 0021-8898

ER -