Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer
Research output: Contribution to journal › Article › Research › peer-review
Authors
Organisational units
Details
| Translated title of the contribution | Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer |
|---|---|
| Original language | English |
| Pages (from-to) | 1931-938 |
| Journal | Journal of applied crystallography |
| DOIs | |
| Publication status | Published - 2014 |
