Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis. / Korsunsky, Alexander M.; Salvati, E.; Lunt, A.G.J. et al.
in: Materials and Design, Jahrgang 145, 2018, S. 55-64.
in: Materials and Design, Jahrgang 145, 2018, S. 55-64.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Korsunsky, AM, Salvati, E, Lunt, AGJ, Sui, T, Mughal, ZM, Daniel, R, Keckes, J, Bemporad, E & Sebastiani, M 2018, 'Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis', Materials and Design, Jg. 145, S. 55-64. https://doi.org/10.1016/j.matdes.2018.02.044
APA
Korsunsky, A. M., Salvati, E., Lunt, A. G. J., Sui, T., Mughal, Z. M., Daniel, R., Keckes, J., Bemporad, E., & Sebastiani, M. (2018). Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis. Materials and Design, 145, 55-64. https://doi.org/10.1016/j.matdes.2018.02.044
Vancouver
Korsunsky AM, Salvati E, Lunt AGJ, Sui T, Mughal ZM, Daniel R et al. Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis. Materials and Design. 2018;145:55-64. doi: 10.1016/j.matdes.2018.02.044
Author
Bibtex - Download
@article{bfeb93d7ebb3444db0425452a5fc2b97,
title = "Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis",
author = "Korsunsky, {Alexander M.} and E. Salvati and A.G.J. Lunt and T. Sui and Z.M. Mughal and Rostislav Daniel and Jozef Keckes and E. Bemporad and M. Sebastiani",
year = "2018",
doi = "10.1016/j.matdes.2018.02.044",
language = "English",
volume = "145",
pages = "55--64",
journal = "Materials and Design",
issn = "0264-1275",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis
AU - Korsunsky, Alexander M.
AU - Salvati, E.
AU - Lunt, A.G.J.
AU - Sui, T.
AU - Mughal, Z.M.
AU - Daniel, Rostislav
AU - Keckes, Jozef
AU - Bemporad, E.
AU - Sebastiani, M.
PY - 2018
Y1 - 2018
U2 - 10.1016/j.matdes.2018.02.044
DO - 10.1016/j.matdes.2018.02.044
M3 - Article
VL - 145
SP - 55
EP - 64
JO - Materials and Design
JF - Materials and Design
SN - 0264-1275
ER -
