Method development for the cyclic characterization of thin copper layers for PCB applications
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Method development for the cyclic characterization of thin copper layers for PCB applications. / Fellner, Klaus; Fuchs, Peter Filipp; Pinter, Gerald et al.
in: Circuit World, Jahrgang 40, 2014, S. 53-60.
in: Circuit World, Jahrgang 40, 2014, S. 53-60.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Fellner, K, Fuchs, PF, Pinter, G, Antretter, T & Krivec, T 2014, 'Method development for the cyclic characterization of thin copper layers for PCB applications', Circuit World, Jg. 40, S. 53-60. https://doi.org/10.1108/CW-09-2013-0032
APA
Fellner, K., Fuchs, P. F., Pinter, G., Antretter, T., & Krivec, T. (2014). Method development for the cyclic characterization of thin copper layers for PCB applications. Circuit World, 40, 53-60. https://doi.org/10.1108/CW-09-2013-0032
Vancouver
Fellner K, Fuchs PF, Pinter G, Antretter T, Krivec T. Method development for the cyclic characterization of thin copper layers for PCB applications. Circuit World. 2014;40:53-60. doi: 10.1108/CW-09-2013-0032
Author
Bibtex - Download
@article{d9f1d3ad53014b62886eadb9cd102324,
title = "Method development for the cyclic characterization of thin copper layers for PCB applications",
author = "Klaus Fellner and Fuchs, {Peter Filipp} and Gerald Pinter and Thomas Antretter and Thomas Krivec",
year = "2014",
doi = "10.1108/CW-09-2013-0032",
language = "English",
volume = "40",
pages = "53--60",
journal = "Circuit World",
issn = "0305-6120",
publisher = "Emerald Group Publishing Ltd.",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Method development for the cyclic characterization of thin copper layers for PCB applications
AU - Fellner, Klaus
AU - Fuchs, Peter Filipp
AU - Pinter, Gerald
AU - Antretter, Thomas
AU - Krivec, Thomas
PY - 2014
Y1 - 2014
U2 - 10.1108/CW-09-2013-0032
DO - 10.1108/CW-09-2013-0032
M3 - Article
VL - 40
SP - 53
EP - 60
JO - Circuit World
JF - Circuit World
SN - 0305-6120
ER -