Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100). / Keckes, Jozef; Hafok, Martin; Eiper, Ernst et al.
in: Powder diffraction, Jahrgang 19, 2004, S. 367-371.
in: Powder diffraction, Jahrgang 19, 2004, S. 367-371.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Keckes, J, Hafok, M, Eiper, E, Hofer, A, Resel, R & Eisenmenger-Sittner, C 2004, 'Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)', Powder diffraction, Jg. 19, S. 367-371.
APA
Keckes, J., Hafok, M., Eiper, E., Hofer, A., Resel, R., & Eisenmenger-Sittner, C. (2004). Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100). Powder diffraction, 19, 367-371.
Vancouver
Keckes J, Hafok M, Eiper E, Hofer A, Resel R, Eisenmenger-Sittner C. Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100). Powder diffraction. 2004;19:367-371.
Author
Bibtex - Download
@article{f3db9839478f42fc8dbd6c2ac3b96f89,
title = "Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)",
author = "Jozef Keckes and Martin Hafok and Ernst Eiper and A. Hofer and R. Resel and C. Eisenmenger-Sittner",
year = "2004",
language = "English",
volume = "19",
pages = "367--371",
journal = "Powder diffraction",
issn = "0885-7156",
publisher = "Cambridge University Press",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)
AU - Keckes, Jozef
AU - Hafok, Martin
AU - Eiper, Ernst
AU - Hofer, A.
AU - Resel, R.
AU - Eisenmenger-Sittner, C.
PY - 2004
Y1 - 2004
M3 - Article
VL - 19
SP - 367
EP - 371
JO - Powder diffraction
JF - Powder diffraction
SN - 0885-7156
ER -
