Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. / Eiper, Ernst; Martinschitz, Klaus-Jürgen; Keckes, Jozef.
in: Powder diffraction, Jahrgang 21, 2006, S. 25-29.
in: Powder diffraction, Jahrgang 21, 2006, S. 25-29.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Eiper, E, Martinschitz, K-J & Keckes, J 2006, 'Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films', Powder diffraction, Jg. 21, S. 25-29. https://doi.org/10.1154/1.2040456
APA
Eiper, E., Martinschitz, K.-J., & Keckes, J. (2006). Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. Powder diffraction, 21, 25-29. https://doi.org/10.1154/1.2040456
Vancouver
Eiper E, Martinschitz KJ, Keckes J. Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. Powder diffraction. 2006;21:25-29. doi: 10.1154/1.2040456
Author
Bibtex - Download
@article{512a410e61d64f65a3ce28ead461110c,
title = "Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films",
author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Jozef Keckes",
year = "2006",
doi = "10.1154/1.2040456",
language = "English",
volume = "21",
pages = "25--29",
journal = "Powder diffraction",
issn = "0885-7156",
publisher = "Cambridge University Press",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
AU - Eiper, Ernst
AU - Martinschitz, Klaus-Jürgen
AU - Keckes, Jozef
PY - 2006
Y1 - 2006
U2 - 10.1154/1.2040456
DO - 10.1154/1.2040456
M3 - Article
VL - 21
SP - 25
EP - 29
JO - Powder diffraction
JF - Powder diffraction
SN - 0885-7156
ER -
