Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Standard

Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. / Eiper, Ernst; Martinschitz, Klaus-Jürgen; Keckes, Jozef.
in: Powder diffraction, Jahrgang 21, 2006, S. 25-29.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Author

Bibtex - Download

@article{512a410e61d64f65a3ce28ead461110c,
title = "Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films",
author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Jozef Keckes",
year = "2006",
doi = "10.1154/1.2040456",
language = "English",
volume = "21",
pages = "25--29",
journal = "Powder diffraction",
issn = "0885-7156",
publisher = "Cambridge University Press",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

AU - Eiper, Ernst

AU - Martinschitz, Klaus-Jürgen

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

U2 - 10.1154/1.2040456

DO - 10.1154/1.2040456

M3 - Article

VL - 21

SP - 25

EP - 29

JO - Powder diffraction

JF - Powder diffraction

SN - 0885-7156

ER -