Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae. / Zalesak, J.; Todt, J.; Pitonak, R. et al.
in: Journal of applied crystallography, Jahrgang 49, Nr. 6, 2016, S. 2217-2225.
in: Journal of applied crystallography, Jahrgang 49, Nr. 6, 2016, S. 2217-2225.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Zalesak, J, Todt, J, Pitonak, R, Köpf, A, Weißenbacher, R, Sartory, B, Burghammer, M, Daniel, R & Keckes, J 2016, 'Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae', Journal of applied crystallography, Jg. 49, Nr. 6, S. 2217-2225. https://doi.org/10.1107/S1600576716017258
APA
Zalesak, J., Todt, J., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Burghammer, M., Daniel, R., & Keckes, J. (2016). Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae. Journal of applied crystallography, 49(6), 2217-2225. https://doi.org/10.1107/S1600576716017258
Vancouver
Zalesak J, Todt J, Pitonak R, Köpf A, Weißenbacher R, Sartory B et al. Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae. Journal of applied crystallography. 2016;49(6):2217-2225. doi: 10.1107/S1600576716017258
Author
Bibtex - Download
@article{08985fb6219e406d882bed6f9c22778d,
title = "Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae",
author = "J. Zalesak and J. Todt and R. Pitonak and A. K{\"o}pf and R. Wei{\ss}enbacher and B. Sartory and M. Burghammer and R. Daniel and J. Keckes",
note = "cited By 0",
year = "2016",
doi = "10.1107/S1600576716017258",
language = "Undefined/Unknown",
volume = "49",
pages = "2217--2225",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",
number = "6",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae
AU - Zalesak, J.
AU - Todt, J.
AU - Pitonak, R.
AU - Köpf, A.
AU - Weißenbacher, R.
AU - Sartory, B.
AU - Burghammer, M.
AU - Daniel, R.
AU - Keckes, J.
N1 - cited By 0
PY - 2016
Y1 - 2016
U2 - 10.1107/S1600576716017258
DO - 10.1107/S1600576716017258
M3 - Article
VL - 49
SP - 2217
EP - 2225
JO - Journal of applied crystallography
JF - Journal of applied crystallography
SN - 0021-8898
IS - 6
ER -
