Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

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Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae. / Zalesak, J.; Todt, J.; Pitonak, R. et al.
In: Journal of applied crystallography, Vol. 49, No. 6, 2016, p. 2217-2225.

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@article{08985fb6219e406d882bed6f9c22778d,
title = "Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae",
author = "J. Zalesak and J. Todt and R. Pitonak and A. K{\"o}pf and R. Wei{\ss}enbacher and B. Sartory and M. Burghammer and R. Daniel and J. Keckes",
note = "cited By 0",
year = "2016",
doi = "10.1107/S1600576716017258",
language = "Undefined/Unknown",
volume = "49",
pages = "2217--2225",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",
number = "6",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

AU - Zalesak, J.

AU - Todt, J.

AU - Pitonak, R.

AU - Köpf, A.

AU - Weißenbacher, R.

AU - Sartory, B.

AU - Burghammer, M.

AU - Daniel, R.

AU - Keckes, J.

N1 - cited By 0

PY - 2016

Y1 - 2016

U2 - 10.1107/S1600576716017258

DO - 10.1107/S1600576716017258

M3 - Article

VL - 49

SP - 2217

EP - 2225

JO - Journal of applied crystallography

JF - Journal of applied crystallography

SN - 0021-8898

IS - 6

ER -