Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis
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In: Materials characterization, Vol. 172.2021, No. February, 110860, 25.12.2020.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis
AU - Wiessner, Manfred
AU - Angerer, Paul
AU - van der Zwaag, Sybrand
AU - Gamsjäger, Ernst
PY - 2020/12/25
Y1 - 2020/12/25
KW - Bayesian statistics
KW - Dislocation densities
KW - Levenberg-Marquardt
KW - Markov Chain Monte Carlo
KW - Rietveld method
KW - Stainless steels
UR - http://www.scopus.com/inward/record.url?scp=85098967119&partnerID=8YFLogxK
U2 - 10.1016/j.matchar.2020.110860
DO - 10.1016/j.matchar.2020.110860
M3 - Article
AN - SCOPUS:85098967119
VL - 172.2021
JO - Materials characterization
JF - Materials characterization
SN - 1044-5803
IS - February
M1 - 110860
ER -