Latest Research Output

• Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis

  Research output: Contribution to journal › Article › Research › peer-review

• Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures

  Research output: Contribution to journal › Article › Research › peer-review

• Thermal stability of residual stresses in Ti-6Al-4V components

  Research output: Contribution to journal › Conference article › peer-review