Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis

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Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis. / Wiessner, Manfred; Angerer, Paul; van der Zwaag, Sybrand et al.
in: Materials characterization, Jahrgang 172.2021, Nr. February, 110860, 25.12.2020.

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Harvard

Wiessner, M, Angerer, P, van der Zwaag, S & Gamsjäger, E 2020, 'Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis', Materials characterization, Jg. 172.2021, Nr. February, 110860. https://doi.org/10.1016/j.matchar.2020.110860

APA

Wiessner, M., Angerer, P., van der Zwaag, S., & Gamsjäger, E. (2020). Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis. Materials characterization, 172.2021(February), Artikel 110860. https://doi.org/10.1016/j.matchar.2020.110860

Vancouver

Wiessner M, Angerer P, van der Zwaag S, Gamsjäger E. Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis. Materials characterization. 2020 Dez 25;172.2021(February):110860. doi: 10.1016/j.matchar.2020.110860

Author

Wiessner, Manfred ; Angerer, Paul ; van der Zwaag, Sybrand et al. / Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis. in: Materials characterization. 2020 ; Jahrgang 172.2021, Nr. February.

Bibtex - Download

@article{2f30cb9c37c7435da770bd14902ebee5,
title = "Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis",
keywords = "Bayesian statistics, Dislocation densities, Levenberg-Marquardt, Markov Chain Monte Carlo, Rietveld method, Stainless steels",
author = "Manfred Wiessner and Paul Angerer and {van der Zwaag}, Sybrand and Ernst Gamsj{\"a}ger",
year = "2020",
month = dec,
day = "25",
doi = "10.1016/j.matchar.2020.110860",
language = "English",
volume = "172.2021",
journal = "Materials characterization",
issn = "1044-5803",
publisher = "Elsevier",
number = "February",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis

AU - Wiessner, Manfred

AU - Angerer, Paul

AU - van der Zwaag, Sybrand

AU - Gamsjäger, Ernst

PY - 2020/12/25

Y1 - 2020/12/25

KW - Bayesian statistics

KW - Dislocation densities

KW - Levenberg-Marquardt

KW - Markov Chain Monte Carlo

KW - Rietveld method

KW - Stainless steels

UR - http://www.scopus.com/inward/record.url?scp=85098967119&partnerID=8YFLogxK

U2 - 10.1016/j.matchar.2020.110860

DO - 10.1016/j.matchar.2020.110860

M3 - Article

AN - SCOPUS:85098967119

VL - 172.2021

JO - Materials characterization

JF - Materials characterization

SN - 1044-5803

IS - February

M1 - 110860

ER -

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