Neuester Forschungsoutput

• Transient phase fraction and dislocation density estimation from in-situ X-ray diffraction data with a low signal-to-noise ratio using a Bayesian approach to the Rietveld analysis

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

• Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

• Thermal stability of residual stresses in Ti-6Al-4V components

  Publikationen: Beitrag in Fachzeitschrift › Konferenzartikel › (peer-reviewed)