Topographical and structural investigations of phosphorous-doped silicon films
Research output: Contribution to journal › Article › Research › peer-review
Authors
Organisational units
Details
Translated title of the contribution | Topographical and structural investigations of phosphorous-doped silicon films |
---|---|
Original language | English |
Pages (from-to) | 999-1002 |
Journal | Applied physics / A (Series A, Materials science & processing) |
Volume | 66 |
Publication status | Published - 1998 |