The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
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In: Acta materialia, Vol. 126, 2017, p. 36-43.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
AU - Fancher, C. M.
AU - Brewer, S.
AU - Chung, C. C.
AU - Röhrig, Sören
AU - Rojac, T.
AU - Esteves, G.
AU - Deluca, Marco
AU - Bassiri-Gharb, N.
AU - Jones, J. L.
PY - 2017
Y1 - 2017
KW - In situ X-ray diffraction 180° domain reversal Domain wall motion Non-linear piezoelectric Non-linear dielectric
U2 - http://dx.doi.org/10.1016/j.actamat.2016.12.037
DO - http://dx.doi.org/10.1016/j.actamat.2016.12.037
M3 - Article
VL - 126
SP - 36
EP - 43
JO - Acta materialia
JF - Acta materialia
SN - 1359-6454
ER -