The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

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Standard

The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction. / Fancher, C. M.; Brewer, S.; Chung, C. C. et al.
in: Acta materialia, Jahrgang 126, 2017, S. 36-43.

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Harvard

Fancher, CM, Brewer, S, Chung, CC, Röhrig, S, Rojac, T, Esteves, G, Deluca, M, Bassiri-Gharb, N & Jones, JL 2017, 'The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction', Acta materialia, Jg. 126, S. 36-43. https://doi.org/10.1016/j.actamat.2016.12.037

APA

Fancher, C. M., Brewer, S., Chung, C. C., Röhrig, S., Rojac, T., Esteves, G., Deluca, M., Bassiri-Gharb, N., & Jones, J. L. (2017). The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction. Acta materialia, 126, 36-43. https://doi.org/10.1016/j.actamat.2016.12.037

Vancouver

Fancher CM, Brewer S, Chung CC, Röhrig S, Rojac T, Esteves G et al. The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction. Acta materialia. 2017;126:36-43. doi: http://dx.doi.org/10.1016/j.actamat.2016.12.037

Author

Fancher, C. M. ; Brewer, S. ; Chung, C. C. et al. / The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction. in: Acta materialia. 2017 ; Jahrgang 126. S. 36-43.

Bibtex - Download

@article{19a96be9bbb54417b78e6c7da6e08818,
title = "The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction",
keywords = "In situ X-ray diffraction 180° domain reversal Domain wall motion Non-linear piezoelectric Non-linear dielectric",
author = "Fancher, {C. M.} and S. Brewer and Chung, {C. C.} and S{\"o}ren R{\"o}hrig and T. Rojac and G. Esteves and Marco Deluca and N. Bassiri-Gharb and Jones, {J. L.}",
year = "2017",
doi = "http://dx.doi.org/10.1016/j.actamat.2016.12.037",
language = "English",
volume = "126",
pages = "36--43",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

AU - Fancher, C. M.

AU - Brewer, S.

AU - Chung, C. C.

AU - Röhrig, Sören

AU - Rojac, T.

AU - Esteves, G.

AU - Deluca, Marco

AU - Bassiri-Gharb, N.

AU - Jones, J. L.

PY - 2017

Y1 - 2017

KW - In situ X-ray diffraction 180° domain reversal Domain wall motion Non-linear piezoelectric Non-linear dielectric

U2 - http://dx.doi.org/10.1016/j.actamat.2016.12.037

DO - http://dx.doi.org/10.1016/j.actamat.2016.12.037

M3 - Article

VL - 126

SP - 36

EP - 43

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

ER -

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