The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • C. M. Fancher
  • S. Brewer
  • C. C. Chung
  • Sören Röhrig
  • T. Rojac
  • G. Esteves
  • N. Bassiri-Gharb
  • J. L. Jones

Details

Original languageEnglish
Pages (from-to)36-43
Number of pages8
JournalActa materialia
Volume126
DOIs
Publication statusPublished - 2017