Temperature dependent bais-stress measurement in organic thin film Transistors

Research output: Contribution to conferencePosterResearchpeer-review

Standard

Temperature dependent bais-stress measurement in organic thin film Transistors. / Obermüller, T.; Marchl, M.; Ausserlechner, S.J. et al.
2009. Poster session presented at International Conference on Organic Electronics 2009, Liverpool, United Kingdom.

Research output: Contribution to conferencePosterResearchpeer-review

Harvard

Obermüller, T, Marchl, M, Ausserlechner, SJ, Golubkov, AW, Haase, A, Stadlober, B, Hauser, L, Trimmel, G, Edler, M, Grießer, T, Kern, W & Zojer, E 2009, 'Temperature dependent bais-stress measurement in organic thin film Transistors', International Conference on Organic Electronics 2009, Liverpool, United Kingdom, 15/06/09 - 17/06/09.

APA

Obermüller, T., Marchl, M., Ausserlechner, S. J., Golubkov, A. W., Haase, A., Stadlober, B., Hauser, L., Trimmel, G., Edler, M., Grießer, T., Kern, W., & Zojer, E. (2009). Temperature dependent bais-stress measurement in organic thin film Transistors. Poster session presented at International Conference on Organic Electronics 2009, Liverpool, United Kingdom.

Vancouver

Obermüller T, Marchl M, Ausserlechner SJ, Golubkov AW, Haase A, Stadlober B et al.. Temperature dependent bais-stress measurement in organic thin film Transistors. 2009. Poster session presented at International Conference on Organic Electronics 2009, Liverpool, United Kingdom.

Author

Obermüller, T. ; Marchl, M. ; Ausserlechner, S.J. et al. / Temperature dependent bais-stress measurement in organic thin film Transistors. Poster session presented at International Conference on Organic Electronics 2009, Liverpool, United Kingdom.

Bibtex - Download

@conference{89d1023ab60d4a7080add1674ae8a8f9,
title = "Temperature dependent bais-stress measurement in organic thin film Transistors",
author = "T. Oberm{\"u}ller and M. Marchl and S.J. Ausserlechner and Golubkov, {A. W.} and A. Haase and B. Stadlober and L. Hauser and G. Trimmel and Matthias Edler and Thomas Grie{\ss}er and Wolfgang Kern and E. Zojer",
year = "2009",
language = "Deutsch",
note = "International Conference on Organic Electronics 2009 ; Conference date: 15-06-2009 Through 17-06-2009",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Temperature dependent bais-stress measurement in organic thin film Transistors

AU - Obermüller, T.

AU - Marchl, M.

AU - Ausserlechner, S.J.

AU - Golubkov, A. W.

AU - Haase, A.

AU - Stadlober, B.

AU - Hauser, L.

AU - Trimmel, G.

AU - Edler, Matthias

AU - Grießer, Thomas

AU - Kern, Wolfgang

AU - Zojer, E.

PY - 2009

Y1 - 2009

M3 - Poster

T2 - International Conference on Organic Electronics 2009

Y2 - 15 June 2009 through 17 June 2009

ER -