Temperature dependent bais-stress measurement in organic thin film Transistors

Research output: Contribution to conference › Poster › Research › peer-review

Authors

  • T. Obermüller
  • M. Marchl
  • S.J. Ausserlechner
  • A. W. Golubkov
  • A. Haase
  • B. Stadlober
  • L. Hauser
  • G. Trimmel
  • E. Zojer

Organisational units

Details

Translated title of the contributionTemperature dependent bais-stress measurement in organic thin film Transistors
Original languageGerman
Publication statusPublished - 2009
EventInternational Conference on Organic Electronics 2009 - University of Liverpool, Liverpool, United Kingdom
Duration: 15 Jun 2009 → 17 Jun 2009

Conference

ConferenceInternational Conference on Organic Electronics 2009
Country/TerritoryUnited Kingdom
CityLiverpool
Period15/06/09 → 17/06/09
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