Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Authors

  • M. Petrov
  • David Holec
  • L. Lymperakis
  • J Neugebauer
  • C.J. Humphreys

Details

Translated title of the contributionStrain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN
Original languageEnglish
Title of host publicationProceeding of International Conference on Microscopy of Semiconducting Materials 2011
Pages1-4
DOIs
Publication statusPublished - 2011