Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN. / Petrov, M.; Holec, David; Lymperakis, L. et al.
Proceeding of International Conference on Microscopy of Semiconducting Materials 2011. 2011. p. 1-4.
Proceeding of International Conference on Microscopy of Semiconducting Materials 2011. 2011. p. 1-4.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Harvard
Petrov, M, Holec, D, Lymperakis, L, Neugebauer, J & Humphreys, CJ 2011, Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN. in Proceeding of International Conference on Microscopy of Semiconducting Materials 2011. pp. 1-4. https://doi.org/10.1088/1742-6596/326/1/012016
APA
Petrov, M., Holec, D., Lymperakis, L., Neugebauer, J., & Humphreys, C. J. (2011). Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN. In Proceeding of International Conference on Microscopy of Semiconducting Materials 2011 (pp. 1-4) https://doi.org/10.1088/1742-6596/326/1/012016
Vancouver
Petrov M, Holec D, Lymperakis L, Neugebauer J, Humphreys CJ. Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN. In Proceeding of International Conference on Microscopy of Semiconducting Materials 2011. 2011. p. 1-4 doi: 10.1088/1742-6596/326/1/012016
Author
Bibtex - Download
@inproceedings{40ed3faa159d45a89fe5c458f145c798,
title = "Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN",
author = "M. Petrov and David Holec and L. Lymperakis and J Neugebauer and C.J. Humphreys",
year = "2011",
doi = "10.1088/1742-6596/326/1/012016",
language = "English",
pages = "1--4",
booktitle = "Proceeding of International Conference on Microscopy of Semiconducting Materials 2011",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Strain-induced effects on the electronic structure and n K-edge ELNES of wurtzite AlN and AlxGa1-xN
AU - Petrov, M.
AU - Holec, David
AU - Lymperakis, L.
AU - Neugebauer, J
AU - Humphreys, C.J.
PY - 2011
Y1 - 2011
U2 - 10.1088/1742-6596/326/1/012016
DO - 10.1088/1742-6596/326/1/012016
M3 - Conference contribution
SP - 1
EP - 4
BT - Proceeding of International Conference on Microscopy of Semiconducting Materials 2011
ER -
