Strain Analysis by Regularized Non-Rigid Registration
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Standard
Strain Analysis by Regularized Non-Rigid Registration. / Badshah, Amir; O'Leary, Paul; Harker, Matthew et al.
Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering, 2012. p. 8300D-1-8300D-6.
Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering, 2012. p. 8300D-1-8300D-6.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Harvard
Badshah, A, O'Leary, P, Harker, M & Tscharnuter, D 2012, Strain Analysis by Regularized Non-Rigid Registration. in Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering, pp. 8300D-1-8300D-6. https://doi.org/10.1117/12.920003
APA
Badshah, A., O'Leary, P., Harker, M., & Tscharnuter, D. (2012). Strain Analysis by Regularized Non-Rigid Registration. In Eleltronic Imaging 2012 (pp. 8300D-1-8300D-6). SPIE, The Internat. Soc. for Optical Engineering. https://doi.org/10.1117/12.920003
Vancouver
Badshah A, O'Leary P, Harker M, Tscharnuter D. Strain Analysis by Regularized Non-Rigid Registration. In Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering. 2012. p. 8300D-1-8300D-6 doi: 10.1117/12.920003
Author
Bibtex - Download
@inproceedings{74daaad5ccb044aa8e8479c374532ab4,
title = "Strain Analysis by Regularized Non-Rigid Registration",
author = "Amir Badshah and Paul O'Leary and Matthew Harker and Daniel Tscharnuter",
year = "2012",
doi = "10.1117/12.920003",
language = "English",
isbn = "978-0-8194-8954-8",
pages = "8300D--1--8300D--6",
booktitle = "Eleltronic Imaging 2012",
publisher = "SPIE, The Internat. Soc. for Optical Engineering",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Strain Analysis by Regularized Non-Rigid Registration
AU - Badshah, Amir
AU - O'Leary, Paul
AU - Harker, Matthew
AU - Tscharnuter, Daniel
PY - 2012
Y1 - 2012
U2 - 10.1117/12.920003
DO - 10.1117/12.920003
M3 - Conference contribution
SN - 978-0-8194-8954-8
SP - 8300D-1-8300D-6
BT - Eleltronic Imaging 2012
PB - SPIE, The Internat. Soc. for Optical Engineering
ER -
