Strain Analysis by Regularized Non-Rigid Registration

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Strain Analysis by Regularized Non-Rigid Registration. / Badshah, Amir; O'Leary, Paul; Harker, Matthew et al.
Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering, 2012. S. 8300D-1-8300D-6.

Publikationen: Beitrag in Buch/Bericht/KonferenzbandBeitrag in Konferenzband

Harvard

Badshah, A, O'Leary, P, Harker, M & Tscharnuter, D 2012, Strain Analysis by Regularized Non-Rigid Registration. in Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering, S. 8300D-1-8300D-6. https://doi.org/10.1117/12.920003

APA

Badshah, A., O'Leary, P., Harker, M., & Tscharnuter, D. (2012). Strain Analysis by Regularized Non-Rigid Registration. In Eleltronic Imaging 2012 (S. 8300D-1-8300D-6). SPIE, The Internat. Soc. for Optical Engineering. https://doi.org/10.1117/12.920003

Vancouver

Badshah A, O'Leary P, Harker M, Tscharnuter D. Strain Analysis by Regularized Non-Rigid Registration. in Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering. 2012. S. 8300D-1-8300D-6 doi: 10.1117/12.920003

Author

Badshah, Amir ; O'Leary, Paul ; Harker, Matthew et al. / Strain Analysis by Regularized Non-Rigid Registration. Eleltronic Imaging 2012. SPIE, The Internat. Soc. for Optical Engineering, 2012. S. 8300D-1-8300D-6

Bibtex - Download

@inproceedings{74daaad5ccb044aa8e8479c374532ab4,
title = "Strain Analysis by Regularized Non-Rigid Registration",
author = "Amir Badshah and Paul O'Leary and Matthew Harker and Daniel Tscharnuter",
year = "2012",
doi = "10.1117/12.920003",
language = "English",
isbn = "978-0-8194-8954-8",
pages = "8300D--1--8300D--6",
booktitle = "Eleltronic Imaging 2012",
publisher = "SPIE, The Internat. Soc. for Optical Engineering",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - Strain Analysis by Regularized Non-Rigid Registration

AU - Badshah, Amir

AU - O'Leary, Paul

AU - Harker, Matthew

AU - Tscharnuter, Daniel

PY - 2012

Y1 - 2012

U2 - 10.1117/12.920003

DO - 10.1117/12.920003

M3 - Conference contribution

SN - 978-0-8194-8954-8

SP - 8300D-1-8300D-6

BT - Eleltronic Imaging 2012

PB - SPIE, The Internat. Soc. for Optical Engineering

ER -