State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements
Research output: Contribution to journal › Article › Research › peer-review
Standard
State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements. / Tkadletz, Michael; Schiester, Maximilian; Renk, Oliver et al.
In: Microscopy and microanalysis, Vol. 30.2024, No. Supplement 1, 24.07.2024, p. 89-90.
In: Microscopy and microanalysis, Vol. 30.2024, No. Supplement 1, 24.07.2024, p. 89-90.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
APA
Vancouver
Tkadletz M, Schiester M, Renk O, Schalk N. State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements. Microscopy and microanalysis. 2024 Jul 24;30.2024(Supplement 1):89-90. doi: 10.1093/mam/ozae044.045
Author
Bibtex - Download
@article{63ea772bd95c44d8abc4a08f83a53a23,
title = "State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements",
author = "Michael Tkadletz and Maximilian Schiester and Oliver Renk and Nina Schalk",
year = "2024",
month = jul,
day = "24",
doi = "10.1093/mam/ozae044.045",
language = "English",
volume = "30.2024",
pages = "89--90",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "Supplement 1",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements
AU - Tkadletz, Michael
AU - Schiester, Maximilian
AU - Renk, Oliver
AU - Schalk, Nina
PY - 2024/7/24
Y1 - 2024/7/24
U2 - 10.1093/mam/ozae044.045
DO - 10.1093/mam/ozae044.045
M3 - Article
VL - 30.2024
SP - 89
EP - 90
JO - Microscopy and microanalysis
JF - Microscopy and microanalysis
SN - 1431-9276
IS - Supplement 1
ER -
