State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements. / Tkadletz, Michael; Schiester, Maximilian; Renk, Oliver et al.
in: Microscopy and microanalysis, Jahrgang 30.2024, Nr. Supplement 1, 24.07.2024, S. 89-90.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{63ea772bd95c44d8abc4a08f83a53a23,
title = "State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements",
author = "Michael Tkadletz and Maximilian Schiester and Oliver Renk and Nina Schalk",
year = "2024",
month = jul,
day = "24",
doi = "10.1093/mam/ozae044.045",
language = "English",
volume = "30.2024",
pages = "89--90",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "Supplement 1",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements

AU - Tkadletz, Michael

AU - Schiester, Maximilian

AU - Renk, Oliver

AU - Schalk, Nina

PY - 2024/7/24

Y1 - 2024/7/24

U2 - 10.1093/mam/ozae044.045

DO - 10.1093/mam/ozae044.045

M3 - Article

VL - 30.2024

SP - 89

EP - 90

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

SN - 1431-9276

IS - Supplement 1

ER -