Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz. / Tejedor, Paloma; Vázquez, Luis; Díez-Merino, Laura et al.
2008. Poster session presented at Intel European Research and Innovation Conference, Leixlip, Ireland.
2008. Poster session presented at Intel European Research and Innovation Conference, Leixlip, Ireland.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Tejedor, P, Vázquez, L, Díez-Merino, L, Beinik, I & Teichert, C 2008, 'Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz', Intel European Research and Innovation Conference, Leixlip, Ireland, 10/09/08 - 12/09/08.
APA
Tejedor, P., Vázquez, L., Díez-Merino, L., Beinik, I., & Teichert, C. (2008). Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz. Poster session presented at Intel European Research and Innovation Conference, Leixlip, Ireland.
Vancouver
Tejedor P, Vázquez L, Díez-Merino L, Beinik I, Teichert C. Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz. 2008. Poster session presented at Intel European Research and Innovation Conference, Leixlip, Ireland.
Author
Bibtex - Download
@conference{d69d8edc65424033a3629a94743377d5,
title = "Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz",
author = "Paloma Tejedor and Luis V{\'a}zquez and Laura D{\'i}ez-Merino and Igor Beinik and Christian Teichert",
year = "2008",
language = "English",
note = "Intel European Research and Innovation Conference ; Conference date: 10-09-2008 Through 12-09-2008",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
AU - Tejedor, Paloma
AU - Vázquez, Luis
AU - Díez-Merino, Laura
AU - Beinik, Igor
AU - Teichert, Christian
PY - 2008
Y1 - 2008
M3 - Poster
T2 - Intel European Research and Innovation Conference
Y2 - 10 September 2008 through 12 September 2008
ER -
