Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz. / Tejedor, Paloma; Vázquez, Luis; Díez-Merino, Laura et al.
2008. Postersitzung präsentiert bei Intel European Research and Innovation Conference, Leixlip, Irland.
2008. Postersitzung präsentiert bei Intel European Research and Innovation Conference, Leixlip, Irland.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Tejedor, P, Vázquez, L, Díez-Merino, L, Beinik, I & Teichert, C 2008, 'Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz', Intel European Research and Innovation Conference, Leixlip, Irland, 10/09/08 - 12/09/08.
APA
Tejedor, P., Vázquez, L., Díez-Merino, L., Beinik, I., & Teichert, C. (2008). Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz. Postersitzung präsentiert bei Intel European Research and Innovation Conference, Leixlip, Irland.
Vancouver
Tejedor P, Vázquez L, Díez-Merino L, Beinik I, Teichert C. Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz. 2008. Postersitzung präsentiert bei Intel European Research and Innovation Conference, Leixlip, Irland.
Author
Bibtex - Download
@conference{d69d8edc65424033a3629a94743377d5,
title = "Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz",
author = "Paloma Tejedor and Luis V{\'a}zquez and Laura D{\'i}ez-Merino and Igor Beinik and Christian Teichert",
year = "2008",
language = "English",
note = "Intel European Research and Innovation Conference ; Conference date: 10-09-2008 Through 12-09-2008",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
AU - Tejedor, Paloma
AU - Vázquez, Luis
AU - Díez-Merino, Laura
AU - Beinik, Igor
AU - Teichert, Christian
PY - 2008
Y1 - 2008
M3 - Poster
T2 - Intel European Research and Innovation Conference
Y2 - 10 September 2008 through 12 September 2008
ER -
