Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
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| Titel in Übersetzung | Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz |
|---|---|
| Originalsprache | Englisch |
| Status | Veröffentlicht - 2008 |
| Veranstaltung | Intel European Research and Innovation Conference - Leixlip, Irland Dauer: 10 Sept. 2008 → 12 Sept. 2008 |
Konferenz
| Konferenz | Intel European Research and Innovation Conference |
|---|---|
| Land/Gebiet | Irland |
| Ort | Leixlip |
| Zeitraum | 10/09/08 → 12/09/08 |
