Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment

Research output: Contribution to conferencePosterResearchpeer-review

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Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment. / Hofer, Christian; Abermann, Stefan; Teichert, Christian.
2006. Poster session presented at ICN+T 2006, Basel, Switzerland.

Research output: Contribution to conferencePosterResearchpeer-review

Harvard

Hofer, C, Abermann, S & Teichert, C 2006, 'Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment', ICN+T 2006, Basel, Switzerland, 30/07/06 - 4/08/06.

APA

Hofer, C., Abermann, S., & Teichert, C. (2006). Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment. Poster session presented at ICN+T 2006, Basel, Switzerland.

Vancouver

Hofer C, Abermann S, Teichert C. Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment. 2006. Poster session presented at ICN+T 2006, Basel, Switzerland.

Author

Hofer, Christian ; Abermann, Stefan ; Teichert, Christian. / Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment. Poster session presented at ICN+T 2006, Basel, Switzerland.

Bibtex - Download

@conference{8e24786d79b14ce09b487c882ee1cd4f,
title = "Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment",
author = "Christian Hofer and Stefan Abermann and Christian Teichert",
year = "2006",
language = "English",
note = "ICN+T 2006 ; Conference date: 30-07-2006 Through 04-08-2006",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment

AU - Hofer, Christian

AU - Abermann, Stefan

AU - Teichert, Christian

PY - 2006

Y1 - 2006

M3 - Poster

T2 - ICN+T 2006

Y2 - 30 July 2006 through 4 August 2006

ER -