Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment. / Hofer, Christian; Abermann, Stefan; Teichert, Christian.
2006. Postersitzung präsentiert bei International Conference on Nanoscale Science and Technology, Basel, Schweiz.
2006. Postersitzung präsentiert bei International Conference on Nanoscale Science and Technology, Basel, Schweiz.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Hofer, C, Abermann, S & Teichert, C 2006, 'Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment', International Conference on Nanoscale Science and Technology, Basel, Schweiz, 30/07/06 - 4/08/06.
APA
Hofer, C., Abermann, S., & Teichert, C. (2006). Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment. Postersitzung präsentiert bei International Conference on Nanoscale Science and Technology, Basel, Schweiz.
Vancouver
Hofer C, Abermann S, Teichert C. Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment. 2006. Postersitzung präsentiert bei International Conference on Nanoscale Science and Technology, Basel, Schweiz.
Author
Bibtex - Download
@conference{8e24786d79b14ce09b487c882ee1cd4f,
title = "Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment",
author = "Christian Hofer and Stefan Abermann and Christian Teichert",
year = "2006",
language = "English",
note = "ICN+T 2006 ; Conference date: 30-07-2006 Through 04-08-2006",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Si and SiGe Surfaces: Nanostructure Formation During Growth and Ion-Bombardment
AU - Hofer, Christian
AU - Abermann, Stefan
AU - Teichert, Christian
PY - 2006
Y1 - 2006
M3 - Poster
T2 - ICN+T 2006
Y2 - 30 July 2006 through 4 August 2006
ER -
