Research output

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  1. 2010
  2. Published

    AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2

    Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    AFM-Untersuchungen zufallsrauher Polymeroberflächen

    Miskovic, O., Schmied, F. & Teichert, C., 2010

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  4. Published

    Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems

    Weber, A., Resch, K. & Teichert, C., 2010, 10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting. p. 64-67

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  5. Published

    Atomic force microscopy studies on the morphology of polymeric thermotropic glazings for overheating protection applications

    Weber, A., Resch, K. & Teichert, C., 2010, Polymeric Materials 2010. p. 0-0

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  6. Published

    C-AFM and FFM measurements of tribological samples

    Shen, Q. & Teichert, C., 2010

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  7. Published

    Characterization of Kraft Pulp Fiber Surfaces using Higher Harmonic Atomic Force Microscopy

    Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. Published

    Combined C-AFM/PFM investigations of ZnO nanorods

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  9. Published

    Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

    Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  10. Published

    Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

    Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  11. Published

    Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

    Schloffer, M., Teichert, C., Supancic, P., Andreev, A., Hou, Y. & Wang, Z., 2010, In: Journal of the European Ceramic Society. 30, p. 1761-1764

    Research output: Contribution to journal › Article › Research › peer-review

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