Research output

  1. 2015
  2. Published

    Effect of wavelength modulation of arc evaporated Ti-Al-N/Ti-Al-V-N multilayer coatings on microstructure and mechanical/tribological properties

    Pfeiler-Deutschmann, M., Mayrhofer, P. H., Chladil, K., Penoy, M., Michotte, C., Kathrein, M. & Mitterer, C., 1 Jan 2015, In: Thin solid films. 581, p. 20-24 5 p.

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published
  4. Published
  5. Published

    Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography

    Mühlbacher, M., Mendez Martin, F., Sartory, B., Schalk, N., Keckes, J., Lu, J., Hultman, L. & Mitterer, C., 2015, In: Thin solid films. 574, p. 103-109

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published

    Deformation behavior of nanostructured molybdenum thin films on flexible substrates

    Jörg, T., Cordill, M., Glushko, O., Franz, R., Winkler, J. & Mitterer, C., 2015.

    Research output: Contribution to conferencePresentationResearch

  7. Published
  8. Published
  9. Published

    Effect of growth conditions on stress, texture, roughness and self-annealing behavior of sputter deposited Cu films

    Souli, I. & Mitterer, C., 2015.

    Research output: Contribution to conferencePosterResearchpeer-review

  10. Published

    Energy balance and material fluxes in hard coating deposition processes

    Gassner, M., Rebelo De Figueiredo, M., Schalk, N., Franz, R., Weiß, C., Rudigier, H., Holzschuh, H., Bürgin, W., Pohler, M., Czettl, C. & Mitterer, C., 2015.

    Research output: Contribution to conferencePosterResearchpeer-review

  11. Published

    Evaluation of TiN diffusion barrier layers with different microstructures by transmission electron microscopy and atom probe tomography

    Mühlbacher, M., Mendez Martin, F., Sartory, B., Chitu, L., Lu, J., Schalk, N., Keckes, J., Hultman, L. & Mitterer, C., 2015.

    Research output: Contribution to conferencePresentationResearchpeer-review