Research output

  1. 2018
  2. Published

    30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film

    Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published
  4. Published
  5. Published

    Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis

    Korsunsky, A. M., Salvati, E., Lunt, A. G. J., Sui, T., Mughal, Z. M., Daniel, R., Keckes, J., Bemporad, E. & Sebastiani, M., 2018, In: Materials and Design. 145, p. 55-64

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published
  7. 2017
  8. Published
  9. E-pub ahead of print

    Corrigendum to “Structural modifications in sub-Tg annealed CuZr-based metallic glass”

    Sarac, B., Bernasconi, A., Wright, J., Stoica, M., Spieckermann, F., Mühlbacher, M., Keckes, J., Bian, X. L., Wang, G. & Eckert, J., 6 Dec 2017, (E-pub ahead of print) In: Materials science and engineering: A, Structural materials: properties, microstructure and processing. 712.2018, 17 January, p. 819 1 p.

    Research output: Contribution to journalArticleResearchpeer-review

  10. Published

    Gradient residual strain and stress distributions in a high pressure torsion deformed iron disk revealed by high energy X-ray diffraction

    Todt, J., Keckes, J., Winter, G., Staron, P. & Hohenwarter, A., 27 Nov 2017, In: Scripta Materialia. 146.2018, 15 March, p. 178-181 4 p.

    Research output: Contribution to journalArticleResearchpeer-review

  11. E-pub ahead of print

    Resolving alternating stress gradients and dislocation densities across AlxGa1-xN multilayer structures on Si(111)

    Reisinger, M., Tomberger, M., Zechner, J., Daumiller, I., Sartory, B., Ecker, W., Keckes, J. & Lechner, R. T., 16 Oct 2017, (E-pub ahead of print) In: Applied physics letters. 111.2017, 16, p. 162103 4 p.

    Research output: Contribution to journalArticleResearchpeer-review

  12. Published

    High resolution residual stress gradient characterization in W/TiN-stack on Si(100): Correlating in-plane stress and grain size distributions in W sublayer

    Hammer, R., Todt, J., Keckes, J., Sartory, B., Parteder, G., Kraft, J. & Defregger, S., 15 Oct 2017, In: Materials and Design. 132.2017, 15 October, p. 72-78 7 p.

    Research output: Contribution to journalArticleResearchpeer-review

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