Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis

Research output: Contribution to journal › Article › Research › peer-review

Authors

Alexander M. Korsunsky
E. Salvati
A.G.J. Lunt
T. Sui
Z.M. Mughal
E. Bemporad
M. Sebastiani

Organisational units

External Organisational units

University Roma TRE, Engineering Department
University of Oxford

Details

Original language	English
Pages (from-to)	55-64
Journal	Materials and Design
Volume	145
DOIs	https://doi.org/10.1016/j.matdes.2018.02.044
Publication status	Published - 2018

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