Research output

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  1. 2004
  2. Published

    Morphology and growth kinetic of organic thin films deposited by hot wall epitaxy

    Andreev, A., Teichert, C., Hlawacek, G., Hoppe, H., Resel, R., Smilgies, D-M., Sitter, H. & Sariciftci, N. S., 2004, In: Organic electronics. 5, p. 23-27

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Nanostructure formation on ion-eroded SiGe film surfaces

    Hofer, C., Teichert, C. & Kasper, E., 2004, In: Superlattices and microstructures. 36, p. 281-291

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Oriented sexiphenyl single crystal nanoneedles on TiO2 (110)

    Koller, G., Berkebile, S., Krenn, J. R., Tzvetkov, G., Hlawacek, G., Lengyel, O., Netzer, F. P., Teichert, C., Resel, R. & Ramsey, M. G., 2004, In: Advanced materials. 16, p. 2159-2162

    Research output: Contribution to journal › Article › Research › peer-review

  5. Published

    Pattern formation in para-quaterphenyl film growth on gold substrates

    Hlawacek, G., Teichert, C., Müllegger, S., Resel, R. & Winkler, A., 2004, In: Synthetic Metals. 146, p. 383-386

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Structure and morphology of sexiphenyl thin films grown on aluminium (111)

    Resel, R., Salzmann, I., Hlawacek, G., Teichert, C., Koppelhuber, B., Winter, B., Krenn, J. K., Ivanco, J. & Ramsey, M. G., 2004, In: Organic electronics. 5, p. 45-51

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    The manipulation of thin film layer growth of quaterphenyl on Au(111)

    Winkler, A., Müllegger, S., Salzmann, I., Resel, R., Hlawacek, G. & Teichert, C., 2004, Symposium on Surface Science 2004. p. 163-164

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  8. 2003
  9. Published

    Modification and characterization of thin silicon gate oxides using conducting atomic force microscopy

    Kremmer, S., Peissl, S., Teichert, C., Kuchar, F. & Hofer, C., 2003, In: Materials science and engineering B (Solid-state materials for advanced technology). 102, p. 88-93

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite

    Plank, H., Resel, R., Sitter, H., Andreev, A., Sariciftci, N. S., Hlawacek, G., Teichert, C., Thierry, A. & Lotz, B., 2003, In: Thin solid films. 443, p. 108-114

    Research output: Contribution to journal › Article › Research › peer-review

  11. 2002
  12. Published

    35th IUVSTA Workshop “Pattern Formation and Atomic Processes in Epitaxial Growth and Ion Erosion”

    Teichert, C. (ed.), 2002, Eigenverlag.

    Research output: Book/Report › Anthology › Research

  13. Published

    Characterization of silicon gate oxides by conducting atomic-force microscopy

    Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172

    Research output: Contribution to journal › Article › Research › peer-review

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